Part Number Hot Search : 
D6C40HT SG217AK SMX700HG 41FJ020 STV0974 2J272J N5231 1500B
Product Description
Full Text Search
 

To Download CY62147DV30 Datasheet File

  If you can't view the Datasheet, Please click here to try to view without PDF Reader .  
 
 


  Datasheet File OCR Text:
 CY62147DV30
4-Mbit (256K x 16) Static RAM
Features
* Very high speed: 45 ns * Wide voltage range: 2.20V-3.60V * Pin-compatible with CY62147CV25, CY62147CV30, and CY62147CV33 * Ultra-low active power -- Typical active current: 1.5 mA @ f = 1 MHz -- Typical active current: 8 mA @ f = fmax * Ultra low standby power * Easy memory expansion with CE, and OE features * Automatic power-down when deselected * CMOS for optimum speed/power * Packages offered 48-ball BGA and 44-pin TSOPII * Also available in Lead-Free packages * Byte power-down feature an automatic power-down feature that significantly reduces power consumption. The device can also be put into standby mode reducing power consumption by more than 99% when deselected (CE HIGH or both BLE and BHE are HIGH). The input/output pins (I/O0 through I/O15) are placed in a high-impedance state when: deselected (CE HIGH), outputs are disabled (OE HIGH), both Byte High Enable and Byte Low Enable are disabled (BHE, BLE HIGH), or during a write operation (CE LOW and WE LOW). Writing to the device is accomplished by taking Chip Enable (CE) and Write Enable (WE) inputs LOW. If Byte Low Enable (BLE) is LOW, then data from I/O pins (I/O0 through I/O7), is written into the location specified on the address pins (A0 through A17). If Byte High Enable (BHE) is LOW, then data from I/O pins (I/O8 through I/O15) is written into the location specified on the address pins (A0 through A17). Reading from the device is accomplished by taking Chip Enable (CE) and Output Enable (OE) LOW while forcing the Write Enable (WE) HIGH. If Byte Low Enable (BLE) is LOW, then data from the memory location specified by the address pins will appear on I/O0 to I/O7. If Byte High Enable (BHE) is LOW, then data from memory will appear on I/O8 to I/O15. See the truth table at the back of this data sheet for a complete description of read and write modes. The CY62147DV30 is available in a 48-ball VFBGA, 44 Pin TSOPII packages.
Functional Description[1]
The CY62147DV30 is a high-performance CMOS static RAM organized as 256K words by 16 bits. This device features advanced circuit design to provide ultra-low active current. This is ideal for providing More Battery LifeTM (MoBL) in portable applications such as cellular telephones. The device also has
Logic Block Diagram
DATA IN DRIVERS A10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0
ROW DECODER
256K x 16 RAM Array
SENSE AMPS
I/O0-I/O7 I/O8-I/O15
COLUMN DECODER BHE WE CE OE BLE
A11 A12
A13 A14 A15 A16
CE
Pow er Down Circuit
BHE BLE
Note: 1. For best practice recommendations, please refer to the Cypress application note "System Design Guidelines" on http://www.cypress.com.
Cypress Semiconductor Corporation Document #: 38-05340 Rev. *D
*
3901 North First Street
A17
*
San Jose, CA 95134 * 408-943-2600 Revised February 2, 2005
CY62147DV30
Pin Configuration[2, 3, 4]
VFBGA (Top View)
1 BLE I/O8 I/O9 VSS VCC I/O14 I/O15 NC 2 OE BHE I/O10 I/O11 3 A0 A3 A5 A17 4 A1 A4 A6 A7 A16 A15 A13 A10 5 A2 CE I/O1 I/O3 I/O4 I/O5 WE A11 6 NC I/O0 I/O2 Vcc Vss I/O6 I/O7 NC A B C D E F G H A4 A3 A2 A1 A0 CE I/O0 I/O1 I/O2 I/O3 VCC VSS I/O4 I/O5 I/O6 I/O7 WE A17 A16 A15 A14 A13
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23
44 TSOP II (Top View)
I/O12 DNU I/O13 NC A8 A14 A12 A9
A5 A6 A7 OE BHE BLE I/O15 I/O14 I/O13 I/O12 VSS VCC I/O11 I/O10 I/O9 I/O8 NC A8 A9 A10 A11 A12
Product Portfolio
Power Dissipation Product Min. CY62147DV30L CY62147DV30LL CY62147DV30L CY62147DV30LL CY62147DV30L CY62147DV30LL
Notes: 2. NC pins are not internally connected on the die. 3. DNU pins have to be left floating or tied to VSS to ensure proper application. 4. Pins H1, G2, and H6 in the BGA package are address expansion pins for 8 Mb, 16 Mb, and 32 Mb, respectively. 5. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ.), TA = 25C.
VCC Range (V) Typ.[5] 3.0 3.0 3.0 Max. 3.60 3.60 3.60 2.20V 2.20V 2.20V
Speed (ns) 45 55 70
Operating ICC (mA) f = 1MHz Typ.[5] 1.5 1.5 1.5 Max. 3 3 3 f = fmax Typ.[5] 10 8 8 Max. 20 15 15 Standby ISB2 (A) Typ.[5] 2 2 2 Max. 12 8 12 8 12 8
Document #: 38-05340 Rev. *D
Page 2 of 12
CY62147DV30
Maximum Ratings
(Above which the useful life may be impaired. For user guidelines, not tested.) Storage Temperature ................................. -65C to +150C Ambient Temperature with Power Applied............................................. -55C to +125C Supply Voltage to Ground Potential ......................................-0.3V to + VCC(MAX) + 0.3V DC Voltage Applied to Outputs in High-Z State[6,7] ..........................-0.3V to VCC(MAX) + 0.3V DC Input Voltage[6,7] ...................... -0.3V to VCC(MAX) + 0.3V Output Current into Outputs (LOW)............................. 20 mA Static Discharge Voltage........................................... >2001V (per MIL-STD-883, Method 3015) Latch-up Current...................................................... >200 mA Device CY62147DV30L CY62147DV30LL Range Ambient Temperature (TA) VCC[8]
Industrial -40C to +85C 2.20V to 3.60V
Electrical Characteristics (Over the Operating Range)
CY62147DV30-45 Parameter Description VOH VOL VIH Test Conditions Min. 2.0 2.4 0.4 0.4 1.8 2.2 -0.3 -0.3 -1 VCC + 1.8 0.3V VCC + 2.2 0.3V 0.6 0.8 +1 -0.3 -0.3 -1 Typ.[5] Output HIGH IOH = -0.1 mA VCC = 2.20V Voltage IOH = -1.0 mA VCC = 2.70V Output LOW IOL = 0.1 mA VCC = 2.20V Voltage IOL = 2.1 mA VCC = 2.70V Input HIGH Voltage VCC = 2.2V to 2.7V VCC= 2.7V to 3.6V VIL IIX IOZ ICC Input LOW Voltage Input Leakage Current Output Leakage Current VCC Operating Supply Current VCC = 2.2V to 2.7V VCC= 2.7V to 3.6V GND < VI < VCC GND < VO < VCC, Output Disabled f = fMAX = 1/tRC f = 1 MHz VCC=VCCmax IOUT = 0 mA CMOS levels CY62147DV30-55
[5]
CY62147DV30-70 Max. Unit V V 0.4 0.4 VCC + 0.3V VCC + 0.3V 0.6 0.8 +1 V V V V V V A 2.0 2.4
Max. Min. Typ. 2.0 2.4
Max. Min. Typ.[5]
0.4 0.4 VCC + 1.8 0.3V VCC + 2.2 0.3V 0.6 0.8 +1 -0.3 -0.3 -1
-1
+1
-1
+1
-1
+1
A
10 1.5 2
20 3 12 8
8 1.5 2
15 3 12 8
8 1.5 2
15 3 12 8
mA mA A
ISB1
CE > VCC-0.2V, Automatic L CE VIN>VCC-0.2V, VIN<0.2V) LL Power-Down f = fMAX (Address and Data Current -- Only), CMOS f = 0 (OE, WE, BHE and BLE), VCC = 3.60V Inputs CE > VCC - 0.2V, Automatic CE VIN > VCC - 0.2V or Power-Down VIN < 0.2V, Current -- f = 0, VCC = 3.60V CMOS Inputs L LL
ISB2
2
12 8
2
12 8
2
12 8
A
Notes: 6. VIL(min.) = -2.0V for pulse durations less than 20 ns. 7. VIH(max)=VCC + 0.75V for pulse durations less than 20 ns. 8. Full device AC operation assumes a 100-s ramp time from 0 to VCC(min) and 200-s wait time after VCC stabilization.
Document #: 38-05340 Rev. *D
Page 3 of 12
CY62147DV30
Capacitance (for all packages)[9]
Parameter CIN COUT Description Input Capacitance Output Capacitance Test Conditions TA = 25C, f = 1 MHz, VCC = VCC(typ) Max. 10 10 Unit pF pF
Thermal Resistance[9]
Parameter JA JC Description Thermal Resistance (Junction to Ambient) Thermal Resistance (Junction to Case) Test Conditions Still Air, soldered on a 3 x 4.5 inch, four-layer printed circuit board BGA 72 8.86 TSOP II 75.13 8.95 Unit C/W C/W
AC Test Loads and Waveforms[10]
VCC OUTPUT 50 pF INCLUDING JIG AND SCOPE R1 VCC R2 10% GND Rise Time = 1 V/ns ALL INPUT PULSES 90% 90% 10% Fall Time = 1 V/ns
Equivalent to:
THE VENIN EQUIVALENT RTH OUTPUT V 3.0V 1103 1554 645 1.75 Unit V
Parameters R1 R2 RTH VTH
2.50V 16667 15385 8000 1.20
Data Retention Characteristics (Over the Operating Range)
Parameter VDR ICCDR Description VCC for Data Retention Data Retention Current VCC= 1.5V CE > VCC - 0.2V, VIN > VCC - 0.2V or VIN < 0.2V L LL 0 tRC Conditions Min. 1.5 9 6 ns ns Typ.[5] Max. Unit V A
tCDR[9] tR[11]
Chip Deselect to Data Retention Time Operation Recovery Time
Data Retention Waveform[12]
VCC CE or BHE.BLE
VCC(min)
tCDR
DATA RETENTION MODE VDR > 1.5 V
VCC(min)
tR
Notes: 9. Tested initially and after any design or process changes that may affect these parameters. 10. Test condition for the 45 ns part is a load capacitance of 30 pF. 11. Full device operation requires linear VCC ramp from VDR to VCC(min.) > 100 s or stable at VCC(min.) > 100 s. 12. BHE.BLE is the AND of both BHE and BLE. Chip can be deselected by either disabling the chip enable signals or by disabling both BHE and BLE.
Document #: 38-05340 Rev. *D
Page 4 of 12
CY62147DV30
Switching Characteristics Over the Operating Range[13]
45 ns[10] Parameter Read Cycle tRC tAA tOHA tACE tDOE tLZOE tHZOE tLZCE tHZCE tPU tPD tDBE tLZBE tHZBE Write Cycle[16] tWC tSCE tAW tHA tSA tPWE tBW tSD tHD tHZWE tLZWE Write Cycle Time CE LOW to Write End Address Set-up to Write End Address Hold from Write End Address Set-up to Write Start WE Pulse Width BLE/BHE LOW to Write End Data Set-up to Write End Data Hold from Write End WE LOW to High-Z[14, 15]
[14]
55 ns Min. 55 Max. Min. 70 55 10 10 55 25 5 5 20 10 10 20 0 0 55 55 10 10 20 55 40 40 0 0 40 40 25 0 70 60 60 0 0 45 60 30 0 20 10 10
70 ns Max. Unit ns 70 70 35 25 25 70 70 25 ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns 25 ns ns
Description Read Cycle Time Address to Data Valid Data Hold from Address Change CE LOW to Data Valid OE LOW to Data Valid OE LOW to LOW Z CE LOW to Low
[14]
Min. 45
Max.
45 10 45 25 5 15 10 20 0 45 45 10 15 45 40 40 0 0 35 40 25 0 15 10
OE HIGH to High Z[14, 15] Z[14] Z[14, 15] CE HIGH to High
CE LOW to Power-Up CE HIGH to Power-Down BLE/BHE LOW to Data Valid BLE/BHE LOW to Low Z[14] Z[14, 15] BLE/BHE HIGH to HIGH
WE HIGH to Low-Z
Notes: 13. Test conditions for all parameters other than three-state parameters assume signal transition time of 3 ns (1 V/ns) or less, timing reference levels of VCC(typ)/2, input pulse levels of 0 to VCC(typ.), and output loading of the specified IOL/IOH as shown in the "AC Test Loads and Waveforms" section. 14. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZBE is less than tLZBE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device. 15. tHZOE, tHZCE, tHZBE, and tHZWE transitions are measured when the outputs enter a high impedence state. 16. The internal Write time of the memory is defined by the overlap of WE, CE = VIL, BHE and/or BLE = VIL. All signals must be ACTIVE to initiate a write and any of these signals can terminate a write by going INACTIVE. The data input set-up and hold timing should be referenced to the edge of the signal that terminates the write.
Document #: 38-05340 Rev. *D
Page 5 of 12
CY62147DV30
Switching Waveforms
Read Cycle 1 (Address Transition Controlled)[17, 18] tRC ADDRESS tOHA DATA OUT PREVIOUS DATA VALID tAA DATA VALID
Read Cycle No. 2 (OE Controlled)[18, 19]
ADDRESS
CE tACE OE tDOE BHE/BLE tLZOE
tRC tPD tHZCE
tHZOE
tHZBE tDBE tLZBE DATA OUT HIGH IMPEDANCE tLZCE VCC SUPPLY CURRENT tPU 50% 50% ICC ISB DATA VALID HIGH IMPEDANCE
Notes: 17. The device is continuously selected. OE, CE = VIL, BHE and/or BLE = VIL. 18. WE is HIGH for read cycle. 19. Address valid prior to or coincident with CE and BHE, BLE transition LOW.
Document #: 38-05340 Rev. *D
Page 6 of 12
CY62147DV30
Switching Waveforms (continued)
Write Cycle No. 1 (WE Controlled)[16, 20, 21]
tWC ADDRESS tSCE CE tAW WE tSA tPWE tHA
BHE/BLE
tBW
OE tSD DATA I/O NOTE 22 tHZOE DATAIN tHD
Write Cycle No. 2 (CE Controlled)[16, 20, 21]
tWC ADDRESS tSCE CE
tSA
tAW tPWE
tHA
WE
BHE/BLE
tBW
OE tSD DATA I/O NOTE 22 tHZOE
Notes: 20. Data I/O is high impedance if OE = VIH. 21. If CE goes HIGH simultaneously with WE = VIH, the output remains in a high-impedance state. 22. During this period, the I/Os are in output state and input signals should not be applied.
tHD
DATAIN
Document #: 38-05340 Rev. *D
Page 7 of 12
CY62147DV30
Switching Waveforms (continued)
Write Cycle No. 3 (WE Controlled, OE LOW)[21]
tWC ADDRESS tSCE CE tBW tAW tSA WE tSD DATAI/O NOTE 22 tHZWE DATAIN tLZWE tHD tPWE tHA
BHE/BLE
Write Cycle No. 4 (BHE/BLE Controlled, OE
LOW)[21]
tWC
ADDRESS
CE tSCE
tAW BHE/BLE tSA WE
tHZWE
tHA tBW
tPWE tSD DATAIN
tLZWE tHD
DATA I/O
NOTE 22
Document #: 38-05340 Rev. *D
Page 8 of 12
CY62147DV30
Truth Table
CE H X L L L L L L L L L WE X X H H H H H H L L L OE X X L L L H H H X X X BHE X H L H L L H L L H L BLE X H L L H L L H L L H Inputs/Outputs High Z High Z Data Out (I/OO-I/O15) Data Out (I/OO-I/O7); I/O8-I/O15 in High Z Data Out (I/O8-I/O15); I/O0-I/O7 in High Z High Z High Z High Z Data In (I/OO-I/O15) Data In (I/OO-I/O7); I/O8-I/O15 in High Z Data In (I/O8-I/O15); I/O0-I/O7 in High Z Mode Deselect/Power-Down Deselect/Power-Down Read Read Read Output Disabled Output Disabled Output Disabled Write Write Write Power Standby (ISB) Standby (ISB) Active (ICC) Active (ICC) Active (ICC) Active (ICC) Active (ICC) Active (ICC) Active (ICC) Active (ICC) Active (ICC)
Ordering Information
Speed (ns) 45 Ordering Code CY62147DV30LL-45BVI CY62147DV30LL-45BVXI CY62147DV30LL-45ZSXI 55 CY62147DV30L-55BVI CY62147DV30L-55BVXI CY62147DV30LL-55BVI CY62147DV30LL-55BVXI 55 70 CY62147DV30L-55ZSXI CY62147DV30LL-55ZSXI CY62147DV30L-70BVI CY62147DV30L-70BVXI CY62147DV30LL-70BVI CY62147DV30LL-70BVXI 70 CY62147DV30L-70ZSXI CY62147DV30LL-70ZSXI ZS-44 BV48A 48-ball Very Fine Pitch BGA (6 mm x 8mm x 1 mm) 48-ball Very Fine Pitch BGA (6 mm x 8mm x 1 mm) (Pb-free) 48-ball Very Fine Pitch BGA (6 mm x 8mm x 1 mm) 48-ball Very Fine Pitch BGA (6 mm x 8mm x 1 mm) (Pb-free) 44-pin TSOP II (Pb-free) Industrial Industrial ZS-44 ZS-44 BV48A Package Name BV48A Package Type 48-ball Very Fine Pitch BGA (6 mm x 8mm x 1 mm) 48-ball Very Fine Pitch BGA (6 mm x 8mm x 1 mm) (Pb-free) 44-pin TSOP II (Pb-free) 48-ball Very Fine Pitch BGA (6 mm x 8mm x 1 mm) 48-ball Very Fine Pitch BGA (6 mm x 8mm x 1 mm) (Pb-free) 48-ball Very Fine Pitch BGA (6 mm x 8mm x 1 mm) 48-ball Very Fine Pitch BGA (6 mm x 8mm x 1 mm) (Pb-free) 44-pin TSOP II (Pb-free) Industrial Industrial Operating Range Industrial
Document #: 38-05340 Rev. *D
Page 9 of 12
CY62147DV30
Package Diagram
48-Lead VFBGA (6 x 8 x 1 mm) BV48A
51-85150-*B
Document #: 38-05340 Rev. *D
Page 10 of 12
CY62147DV30
Package Diagram (continued)
44-Pin TSOP II ZS44
51-85087-*A
MoBL is a registered trademark, and More Battery Life is a trademark, of Cypress Semiconductor Corporation. All product and company names mentioned in this document may be the trademarks of their respective holders.
Document #: 38-05340 Rev. *D
Page 11 of 12
(c) Cypress Semiconductor Corporation, 2005. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
CY62147DV30
Document History Page
Document Title:CY62147DV30 MoBL(R) 4-Mbit (256K x 16) Static RAM Document Number: 38-05340 REV. ** *A *B ECN NO. Issue Date 127481 131010 213252 06/17/03 01/23/04 See ECN Orig. of Change HRT CBD AJU New Data Sheet Change from Advance to Preliminary Change from Preliminary to Final Added 70 ns speed bin Modified footnote 7 to include ramp time and wait time Modified input and output capacitance values to 10 pF Modified Thermal Resistance values on page 4 Added "Byte power-down feature" in the features section Modified Ordering Information for Pb-free parts Modified ordering information for 70-ns Speed Bin Added 45-ns Speed Bin in AC, DC and Ordering Information tables Added Footnote #10 on page #4 Added Pb-free package ordering information on page # 9 Changed 44-lead TSOP-II package name on page 11 from Z44 to ZS44 Standardized Icc values across `L' and `LL' bins Description of Change
*C *D
257349 316039
See ECN See ECN
PCI PCI
Document #: 38-05340 Rev. *D
Page 12 of 12


▲Up To Search▲   

 
Price & Availability of CY62147DV30

All Rights Reserved © IC-ON-LINE 2003 - 2022  

[Add Bookmark] [Contact Us] [Link exchange] [Privacy policy]
Mirror Sites :  [www.datasheet.hk]   [www.maxim4u.com]  [www.ic-on-line.cn] [www.ic-on-line.com] [www.ic-on-line.net] [www.alldatasheet.com.cn] [www.gdcy.com]  [www.gdcy.net]


 . . . . .
  We use cookies to deliver the best possible web experience and assist with our advertising efforts. By continuing to use this site, you consent to the use of cookies. For more information on cookies, please take a look at our Privacy Policy. X